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| Near-Field Sampling | |
In the early 1970s, the extensive antenna-testing research
performed at Georgia Tech included development of techniques to
measure antenna radiation patterns without need for building a
large far-field test range.
One such technique was near-field sampling. Researchers
measured the near field of an antenna, then calculated the far-field
pattern from the measurements, while simultaneously correcting for the
directional effects of the measuring probe.
Researchers investigated plane and cylinder sampling surfaces.
For the plane, the near field was measured in front of the test
stationary antenna by moving the measuring probe both vertically
and horizontally in front of the antenna. For the cylinder,
the antenna was mounted on a rotating turntable in
front of a probe that could be moved on a vertical line.
Near-field measurements can also be use to calculate other
aspects of antenna performance, including gain and polarization
ratio.
Electrical engineering professors Drs. Ed Joy and Marshall
Leach conducted the research under the guidance of the late Dr.
Demetrius Paris, who served as their thesis advisor and mentor.
Georgia Tech file photo
In the 1970s,
Georgia Tech researchers used near-field sampling to
measure antenna radiation patterns, such as this one
for the F-15, without need for building a large far-field test range.
For more information, contact Dr. Ed Joy (retired) or Dr. Marshall Leach, School of Electrical and Computer Engineering, Georgia Tech, Atlanta, GA 30332-0250. (Joy's Telephone: 303-776-5389) (Leach's Telephone: 404-894-2963) (Joy's E-mail:
ed.joy@ee.gatech.edu) (Leach's E-mail:
marshall.leach@ee.gatech.edu)
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Last updated: October 25, 1999